Journal article detailing the launch of Philip’s first automated diffractometer machine

Journal article detailing the launch of Philip’s first automated diffractometer machine ‘PAILRED’ (Philips Automatic Indexing Linear Reciprocal-Space Exploring Diffractometer), used to measure X-Ray diffraction patterns from crystals. Published by Philips Electronic Instruments in the ‘Norelo Reporter’ (vol. 12, No. 2, April-June 1965).

Details

Category:
Experimental Chemistry
Object Number:
2010-72
Materials:
paper (fibre product)
type:
article
credit:
Dr Michael Webster

Parts

Norelco reporter;Vol XII;Number 2;April-June 1965(note poor rear cover smudges)

Norelco reporter;Vol XII;Number 2;April-June 1965(note poor rear cover smudges)

Journal article detailing the launch of Philip’s first automated diffractometer machine ‘PAILRED’ (Philips Automatic Indexing Linear Reciprocal-Space Exploring Diffractometer), used to measure X-Ray diffraction patterns from crystals. Published by Philips Electronic Instruments in the ‘Norelo Reporter’ (vol. 12, No. 2, April-June 1965).

Materials:
paper (fibre product)
Object Number:
2010-72/1
type:
journal article
Norelco Reporter;Vol XII;Number 2; April-June 1965 (note ripped base corner of spine on front page)

Norelco Reporter;Vol XII;Number 2; April-June 1965 (note ripped base corner of spine on front page)

Journal article detailing the launch of Philip’s first automated diffractometer machine ‘PAILRED’ (Philips Automatic Indexing Linear Reciprocal-Space Exploring Diffractometer), used to measure X-Ray diffraction patterns from crystals. Published by Philips Electronic Instruments in the ‘Norelo Reporter’ (vol. 12, No. 2, April-June 1965).

Materials:
paper (fibre product)
Object Number:
2010-72/2
type:
journal article
"Some diffractometer test crystals:a summary" J.Appl. Cryst (1998).31,510-514

"Some diffractometer test crystals:a summary" J.Appl. Cryst (1998).31,510-514

Journal article detailing the launch of Philip’s first automated diffractometer machine ‘PAILRED’ (Philips Automatic Indexing Linear Reciprocal-Space Exploring Diffractometer), used to measure X-Ray diffraction patterns from crystals. Published by Philips Electronic Instruments in the ‘Norelo Reporter’ (vol. 12, No. 2, April-June 1965).

Materials:
paper (fibre product)
Object Number:
2010-72/3
type:
journal article