Stanford-Binet Intelligence Scales (Form M)
Printed card material in storage box, from Stanford-Binet Intelligence Scales (Form M): An intelligence test for Children; devised by Lewis M. Terman and Maud A. Merrill in 1937, used on the University of Aberdeen Experimental Education EdB course, 1949-50; made by Houghton Mifflin Company, Boston, New York, Chicago, Dallas, Atlanta, San Francisco, United States, 1937-1949.
- Measurements:
-
overall: 80 mm x 260 mm x 390 mm,
- Materials:
- metal (unknown) , paper (fibre product) , plastic (unidentified) , wood (unidentified) , cardboard and textile
- Object Number:
- 2000-1244/1
- type:
- psychometric test
- Image ©
- The Board of Trustees of the Science Museum